发明名称 Low-voltage non-volatile semiconductor memory device
摘要 The disclosure is a non-volatile semiconductor memory device including a bias circuit that generates a bias voltage for controlling an NMOS transistor connected to both a bit line and a page buffer circuit. The bias circuit generates a first voltage, which is greater than a power source voltage, as the bias signal in a precharge period of a read operation. The bias circuit also generates a second voltage, which is less than the power source voltage, as the bias signal in a sensing period of the read operation.
申请公布号 US2003174539(A1) 申请公布日期 2003.09.18
申请号 US20030376615 申请日期 2003.02.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BYEON DAE-SEOK;LEE JUNE;LEE GYUNG-HAN
分类号 G11C16/06;G11C5/14;G11C16/02;G11C16/24;G11C16/30;(IPC1-7):G11C16/06 主分类号 G11C16/06
代理机构 代理人
主权项
地址