发明名称 |
Static random access memory cell and method |
摘要 |
A method for forming a scaled static random access memory (SRAM) cell (10) based on an initial SRAM cell for implementation in a technology scaled from an initial technology. The SRAM cells comprise a plurality of transistors. The method comprises determining a reduction in a minimum gate length (46) for the scaled transistors (14, 16, 18) as compared to a minimum gate length for the initial transistors. The method also comprises forming a scaled drive transistor (16) comprising a gate having a gate length (54) reduced as compared to a gate length for an initial drive transistor. The scaled gate length (54) is reduced by less than the determined reduction in the minimum gate length (46).
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申请公布号 |
US6687145(B2) |
申请公布日期 |
2004.02.03 |
申请号 |
US20010028199 |
申请日期 |
2001.12.20 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
HOUSTON THEODORE W. |
分类号 |
G11C11/412;H01L21/8244;H01L27/11;(IPC1-7):G11C7/00 |
主分类号 |
G11C11/412 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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