| 摘要 |
A circuit and a method for determining the operating point of a semiconductor device are provided. An operating point circuit is implemented on a semiconductor device and includes a delay element that receives a first signal and produces a second signal. Since the delay changes depending on the process variation of the semiconductor device, the current temperature of the semiconductor device, and the current supply voltage supplied to the semiconductor, the delay between the first signal and the second signal can be used to determine the operating point of the semiconductor device.
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