发明名称 |
Atomic layer epitaxy for semiconductor gate stack layer for advanced channel devices |
摘要 |
Embodiments of the present disclosure provide methods and apparatus for forming an epitaxial layer on a substrate. The substrate is exposed to pulsed laser radiation to clean, anneal, and/or activate the surface of the substrate. The substrate is then exposed to a deposition precursor in a self-limiting deposition process. The substrate may again be exposed to pulsed laser radiation, and then exposed to a second deposition precursor in a second self-limiting deposition process. The process may be repeated as desired to form an epitaxial layer of very high quality one atomic layer at a time. |
申请公布号 |
US9455143(B2) |
申请公布日期 |
2016.09.27 |
申请号 |
US201514789075 |
申请日期 |
2015.07.01 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
Srinivasan Swaminathan T.;Hunter Aaron Muir;Bauer Matthias;Sade Amikam |
分类号 |
H01L21/02;H01L21/67;H01L21/268;H01L21/687 |
主分类号 |
H01L21/02 |
代理机构 |
Patterson & Sheridan, LLP |
代理人 |
Patterson & Sheridan, LLP |
主权项 |
1. A method, sequentially comprising:
disposing a semiconductor substrate on a support in a vacuum chamber; exposing the semiconductor substrate to a first pulsed laser radiation having a pulse duration between about 10 nsec and about 10 μsec; exposing the semiconductor substrate to a first semiconductor precursor; forming a molecular layer of the first semiconductor precursor on the semiconductor substrate; exposing the semiconductor substrate to a second semiconductor precursor; reacting the second semiconductor precursor with the molecular layer of the first semiconductor precursor to form an epitaxial semiconductor layer; and exposing the epitaxial semiconductor layer to a second pulsed laser radiation having the same pulse duration as the first pulsed laser radiation. |
地址 |
Santa Clara CA US |