发明名称 METHOD FOR FORMING RESIST FILM
摘要 <P>PROBLEM TO BE SOLVED: To form a resist film by spin coating while suitably suppressing variations in the thickness of the film. <P>SOLUTION: In a precoat temperature adjustment section 10, a wafer is mounted on a hot plate 11 and is entirely heated on the hot plate 11, so that the temperature of the wafer is set at a predetermined temperature higher than the temperature of a clean room 1. In a spin coating section 20, a color resist solution is spin coated onto the wafer. In a prebaking section 30, the wafer coated with a color resist film in this way is treated at a temperature of 80&deg;C or higher, thus tightly baking the color resist film. <P>COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004207634(A) 申请公布日期 2004.07.22
申请号 JP20020377551 申请日期 2002.12.26
申请人 SANYO ELECTRIC CO LTD 发明人 KOBAYASHI SHINJI
分类号 G03F7/16;B05D1/40;G02B5/20;G03F7/38;H01L21/027 主分类号 G03F7/16
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