发明名称 Dust particle inspection method for X-ray mask
摘要 Disclosed is an X-ray mask for use in an exposure apparatus for transferring a circuit pattern onto an exposure substrate by use of an X-ray beam to produce a semiconductor device, wherein the X-ray mask includes an X-ray transmission film having a layered X-ray absorptive material formed thereon, and a holding frame for holding the X-ray transmission film, and wherein the X-ray transmission film is held by the holding frame with an even step-like structure defined at its peripheral portion. With this arrangement, a dust particle adhered to the X-ray mask surface and having a predetermined height can be detected precisely, such that a large integration device can be produced effectively.
申请公布号 US6770408(B2) 申请公布日期 2004.08.03
申请号 US20020223301 申请日期 2002.08.20
申请人 CANON KABUSHIKI KAISHA;NITSUBISHI ELECTRIC CORP 发明人 INA HIDEKI;ITOGA KENJI
分类号 H01L21/027;G03F1/22;G03F1/84;G03F7/20;(IPC1-7):G03F9/00 主分类号 H01L21/027
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