发明名称 METHOD AND APPARATUS FOR DETECTING STAIN DEFECT
摘要 <P>PROBLEM TO BE SOLVED: To provide a detection method and a detection apparatus of stain defects that have high detection output also for a defect having a low contract or a small size, automatically determine a threshold for detection as the stain defects, based on statistical brightness data in a detected image, and further achieve the quantitative evaluation of the detected stain defects. <P>SOLUTION: A screen to be inspected is imaged by a CCD camera 6, the difference between an image being captured by the imaging and a background image 14 that is created in advance is obtained to create an inspection image 15, the inspection image is flattened, reduced images in a plurality of stages are created from a flattened image 16, each of the reduced image is filtered for emphasizing defects, the statistical data of the brightness value of each pixel in an image 17 after filtering are calculated, a threshold is determined, based on the brightness statistical data, for judging the presence or absence of defect candidates, and the defect candidates are extracted from an image that is determined to have the defect candidates by using the threshold. <P>COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004226272(A) 申请公布日期 2004.08.12
申请号 JP20030015107 申请日期 2003.01.23
申请人 SEIKO EPSON CORP 发明人 NODA MASAAKI;KOJIMA KOICHI;ICHIKAWA HIRONARI
分类号 G01N21/88;G01M11/00;G06T1/00;G06T5/20 主分类号 G01N21/88
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