| 摘要 |
FIELD: flaw detection technologies. ^ SUBSTANCE: method includes mounting standard imitator with standard flaws of different width but same depth matching given possible size of flaw in direction of x-raying, curve of distribution DeltaD/gammaD=f(b) is built on basis of photometric data of standard flaws images, where DeltaD - contrast of flaw images, gammaD contrast coefficient of radiographic film in area of flaw image, b - width of standard flaw and then by use of given curve sizes of real flaws are estimated. ^ EFFECT: lower laboriousness, higher reliability and precision. ^ 1 dwg |
