发明名称 |
METHOD OF FORMING METAL LINE OF SEMICONDUCTOR DEVICE FOR REDUCING RESISTANCE BY SECURING CONTACT AREA |
摘要 |
PURPOSE: A method of forming a metal line of a semiconductor device is provided to reduce a resistance by securing a contact area between a via and the metal line. CONSTITUTION: A via hole is formed by etching partially an insulating layer of a semiconductor substrate(200). The via hole is buried by forming a first metal layer on the insulating layer. A via(230a) including an erosion region is formed by removing a first metal layer within the via hole. A second metal layer is formed by coating a metal material on the via including the erosion region and the insulating layer. A metal pattern contacting the entire upper surface of the via is formed by etching partially the second metal layer.
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申请公布号 |
KR20040106704(A) |
申请公布日期 |
2004.12.18 |
申请号 |
KR20030037518 |
申请日期 |
2003.06.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, DEOK SEO;PARK, HYEONG MU;YOO, JEONG BAK |
分类号 |
H01L21/3205;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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