发明名称 METHOD OF FORMING METAL LINE OF SEMICONDUCTOR DEVICE FOR REDUCING RESISTANCE BY SECURING CONTACT AREA
摘要 PURPOSE: A method of forming a metal line of a semiconductor device is provided to reduce a resistance by securing a contact area between a via and the metal line. CONSTITUTION: A via hole is formed by etching partially an insulating layer of a semiconductor substrate(200). The via hole is buried by forming a first metal layer on the insulating layer. A via(230a) including an erosion region is formed by removing a first metal layer within the via hole. A second metal layer is formed by coating a metal material on the via including the erosion region and the insulating layer. A metal pattern contacting the entire upper surface of the via is formed by etching partially the second metal layer.
申请公布号 KR20040106704(A) 申请公布日期 2004.12.18
申请号 KR20030037518 申请日期 2003.06.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, DEOK SEO;PARK, HYEONG MU;YOO, JEONG BAK
分类号 H01L21/3205;(IPC1-7):H01L21/320 主分类号 H01L21/3205
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