发明名称 Method of examining purity of dendrimers
摘要 A method of examining the purity of dendrimers is revealed. It comprises steps of measuring a light scattering intensity of a set of pure standards having a specific molecular weight with a static laser light scattering detector by use of flow injection polymer analysis; establishing a scaling relation by doing a regression of a ratio of the light scattering intensity per concentration (I/c) against molecular weight (M.W.); measuring the light scattering intensity of a dendrimer to be tested having the same unit and surface-modified functional group as the set of pure standards, and examining the purity of the dendrimer to be tested according to the scaling relation.
申请公布号 US9470625(B1) 申请公布日期 2016.10.18
申请号 US201514723790 申请日期 2015.05.28
申请人 National Chung Cheng University 发明人 Wang Shau-Chun;Tseng Hui-Yu;Kao Chai-Ling
分类号 G01N21/00;G01N21/47;G01N21/49 主分类号 G01N21/00
代理机构 Rosenberg, Klein & Lee 代理人 Rosenberg, Klein & Lee
主权项 1. A method of examining the purity of dendrimers, comprises the steps of: (A) measuring a light scattering intensity of a set of pure standards having a specific molecular weight with a static laser light scattering detector by use of flow injection polymer analysis; (B) establishing a scaling relation by doing a regression of a ratio of the light scattering intensity per concentration (I/c) on the molecular weight (M.W.) of the set of pure standards; and (C) measuring the light scattering intensity of a dendrimer to be tested and examining the purity of the dendrimer to be tested according to the scaling relation.
地址 Chai-Yi County TW