发明名称 MEASURING DEVICE, COMPENSATION DATA GENERATOR, INSPECTING DEVICE, INFORMATION RECORDING MEDIUM, MEASURING METHOD, COMPENSATION DATA GENERATION METHOD AND INSPECTION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To measure and compensate luminance variation of an organic EL display by every pixel with sufficient accuracy at high speed. <P>SOLUTION: This compensation data generator 2 generates an image pattern signal GS for lighting each block divided by every line and each block divided by every column and supplies the signal to an electrooptic device 1. Then, power source current is measured using an ammeter 500 and its measurement result is stored in a block current storage part 600 as block current Ib. A compensation data generation circuit 700 generates compensation data Dh by every pixel based on two systems of block current Ib and stores the data in a compensation data storage part 800. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005242162(A) 申请公布日期 2005.09.08
申请号 JP20040054184 申请日期 2004.02.27
申请人 SEIKO EPSON CORP 发明人 JO HIROAKI;KASAI TOSHIYUKI;HORIUCHI HIROSHI;NOZAWA TAKESHI
分类号 G01R31/00;G09F9/00;G09G3/20;G09G3/30;H01L51/50;H05B33/10;H05B33/12;H05B33/14 主分类号 G01R31/00
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