发明名称 MANUFACTURING DEVICE OF COATING DEVICE AND ELECTRO-OPTICAL DEVICE AND MANUFACTURING METHOD OF ELECTRO-OPTICAL DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To detect the film thickness unevenness of a coating film applied by a so-called spinless coater-type coating device. <P>SOLUTION: The device is provided with a delivery head 104 moving in the x direction while delivering a coating solution 106 from a delivery outlet 104a extended in the y direction, a film thickness measuring device 109 for measuring the thickness of the coating film 108 formed on the opposed surface of a substrate 102 along the y direction, a judging device 110 for judging whether or not the thickness characteristics in the y direction all range within a predetermined scope with respect to the thickness average value, and an alarm 111 for giving an alarm when the device judges that there exists an unranging portion. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005238188(A) 申请公布日期 2005.09.08
申请号 JP20040055073 申请日期 2004.02.27
申请人 SEIKO EPSON CORP 发明人 NAKANO TOMOYUKI;TAGUCHI SATOSHI;NAGATOYA MASARU;ASADA KOJI
分类号 G03F7/16;B05C5/02;B05C11/00;B05D1/26;B05D3/00;G02B5/20;H01L21/027;H01L51/50;H05B33/10;H05B33/14 主分类号 G03F7/16
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