发明名称 METHOD FOR MANUFACTURING COLOR FILTER SUBSTRATE AND METHOD FOR INSPECTING SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method and an inspection method for a color filter substrate by which whether a transparent conductive film is formed on a position including a pixel formation area of a black matrix or not can be accurately determined. <P>SOLUTION: When the transparent conductive film 5 is stacked in a target formation area L without generating displacement, the superposition of a transparent conductive film mark 11 and an electrode mark 1(a) which are simultaneously stacked is determined by measuring the conductivity of both the marks 11, 1(a). Consequently whether the transparent conductive film 5 is formed on the position including the image formation area R of the black matrix 6 or not can be accurately determined. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005257807(A) 申请公布日期 2005.09.22
申请号 JP20040066244 申请日期 2004.03.09
申请人 ADVANCED DISPLAY INC 发明人 FUJITA YASUO;SUMI AKINORI
分类号 G02B5/20;G02F1/1335;G02F1/1343 主分类号 G02B5/20
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