发明名称 System and method for depth determination of cracks in conducting structures
摘要 The alternating current potential drop ACPD technique is used to monitor surface cracks in electrical conductors. At high frequencies, the current flows in a superficial skin layer. Two distinct solutions are currently available for the thin and thick skin cases. However, there is no general solution that bridges these two modes in a seamless fashion. A numerical model is used to analyze the ACPD of a surface crack with uniform depth. A general solution is given that bridges the thin and thick skin solutions, which closely matches the numerical results, irrespective of the skin thickness. Methods for estimating depth of cracks are provided for surface penetrating cracks and back cracks.
申请公布号 US7519487(B2) 申请公布日期 2009.04.14
申请号 US20070714271 申请日期 2007.03.06
申请人 TECHNION RESEARCH AND DEVELOPMENT FOUNDATION LTD. 发明人 SAGUY HAGIT;RITTEL DANIEL
分类号 G01R19/00 主分类号 G01R19/00
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