发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device which can reduce damage in appearance such as cracks, chinks, or dents caused by external stress, and can improve yield in the manufacture of a thin semiconductor device. SOLUTION: The semiconductor device includes a light-transmitting substrate having a stepped side surface, and the width of which in a portion above the step and closer to one surface is smaller than that in a portion below the step; a semiconductor layer provided on other surface of the light-transmitting substrate; and a stacked layer consisting of a first light-transmitting resin layer covering one surface and a part of side surface of the light-transmitting substrate and a second light-transmitting resin layer. Either of the first light-transmitting resin layer or the second light-transmitting resin layer is a chromatic color. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009200477(A) |
申请公布日期 |
2009.09.03 |
申请号 |
JP20090004432 |
申请日期 |
2009.01.13 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
TAKAHASHI HIDEKAZU;YAMADA HIROMI;MONMA YOHEI;ADACHI HIROKI;YAMAZAKI SHUNPEI |
分类号 |
H01L27/14;G01J1/02;H01L21/301;H01L27/146;H01L31/02 |
主分类号 |
H01L27/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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