发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which can reduce damage in appearance such as cracks, chinks, or dents caused by external stress, and can improve yield in the manufacture of a thin semiconductor device. SOLUTION: The semiconductor device includes a light-transmitting substrate having a stepped side surface, and the width of which in a portion above the step and closer to one surface is smaller than that in a portion below the step; a semiconductor layer provided on other surface of the light-transmitting substrate; and a stacked layer consisting of a first light-transmitting resin layer covering one surface and a part of side surface of the light-transmitting substrate and a second light-transmitting resin layer. Either of the first light-transmitting resin layer or the second light-transmitting resin layer is a chromatic color. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009200477(A) 申请公布日期 2009.09.03
申请号 JP20090004432 申请日期 2009.01.13
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 TAKAHASHI HIDEKAZU;YAMADA HIROMI;MONMA YOHEI;ADACHI HIROKI;YAMAZAKI SHUNPEI
分类号 H01L27/14;G01J1/02;H01L21/301;H01L27/146;H01L31/02 主分类号 H01L27/14
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