发明名称 Array substrates and the manufacturing method thereof, and display panels of enhanced speed of film formation
摘要 The present disclosure relates to an array substrate and the manufacturing method thereof, and a display panel. The array substrate includes a substrate and a plurality of thin film transistors (TFTs). The TFT includes a gate, a gate insulation layer, a trench layer, an etch stop layer (ESL), a source, and a drain. The gate insulation layer is arranged between the gate and the trench layer to insulate the gate from the trench layer, the source. The drain and the ESL are respectively arranged on the trench layer. The ESL is arranged between the source and the drain. The ESL is an aluminum nitride (AlN) film. In this way, the quality of the TFTs may be guaranteed, and the speed of the film formation of the ESL may be enhanced.
申请公布号 US9595539(B2) 申请公布日期 2017.03.14
申请号 US201514765833 申请日期 2015.07.10
申请人 Shenzhen China Star Optoelectronics Technology Co., Ltd 发明人 Wang Zhiwu
分类号 H01L21/00;H01L27/12;H01L29/51;H01L29/49;H01L21/02;H01L29/786;H01L29/66;G02F1/1335;G02F1/1368;G02F1/1362 主分类号 H01L21/00
代理机构 代理人 Cheng Andrew C.
主权项 1. A manufacturing method of array substrates of enhancing speed of film formation, comprising: forming a gate, a gate insulation layer, and a trench layer on a substrate, wherein the gate insulation layer being arranged between the gate and the trench layer; and forming an ESL, a source and a drain on the trench layer, the ESL being arranged between the source and the drain, wherein the ESL is AlN film, and applying a sputtering process by a magnetron sputtering device to form the AlN film on the trench layer, wherein an AL chamber is filled with hydrogen or mixed gas of argon and hydrogen.
地址 Shenzhen, Guangdong CN