发明名称 Semiconductor memory device and method of operating the same
摘要 The semiconductor memory device includes a memory cell array including guarantee blocks, normal blocks, and redundancy blocks. A bad block address indicates which block from the guarantee blocks and the normal blocks is defective, and an indication information indicates whether the bad block address belongs to the guarantee blocks or to the normal blocks. A request block address is supplied together with associated block type information. The block type information indicates whether the request block address belongs to the guarantee blocks or to the normal blocks. A match signal is enabled when the block type information matches the indication information, and the request block address matches the bad block address. The enablement of the match signal allows the defective block to be replaced with one block from the redundancy blocks.
申请公布号 US9490013(B1) 申请公布日期 2016.11.08
申请号 US201615073345 申请日期 2016.03.17
申请人 SK Hynix Inc. 发明人 Park Won Sun
分类号 G11C15/00;G11C15/04;G11C29/04 主分类号 G11C15/00
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A semiconductor memory device comprising: a memory cell array including guarantee blocks, normal blocks, and redundancy blocks; a latch circuit configured to store a bad block address and indication information, wherein the bad block address indicates which block from the guarantee blocks and the normal blocks is defective, and the indication information indicates whether the bad block address belongs to the guarantee blocks or to the normal blocks; a control logic configured to supply a request block address together with associated block type information, wherein the block type information indicates whether the request block address belongs to the guarantee blocks or to the normal blocks; and a comparator configured to enable a match signal when the block type information matches the indication information, and the request block address matches the bad block address, wherein an enablement of the match signal allows the defective block to be replaced with one block from the redundancy blocks.
地址 Gyeonggi-do KR