发明名称 |
Over-mold packaging for wide band-gap semiconductor devices |
摘要 |
A transistor package includes a lead frame and a gallium nitride (GaN) transistor attached to the lead frame. The lead frame and the GaN transistor are surrounded by an over-mold with a glass transition temperature greater than about 135° C. and a flexural modulus less than about 20 GPa. Using an over-mold with a glass transition temperature greater than about 135° C. and a flexural modulus less than about 20 GPa allows the over-mold to handle the heat produced by the GaN transistor while preventing damage to the GaN transistor due to thermal expansion and/or contraction of the over-mold. |
申请公布号 |
US9472480(B2) |
申请公布日期 |
2016.10.18 |
申请号 |
US201414289216 |
申请日期 |
2014.05.28 |
申请人 |
Cree, Inc. |
发明人 |
Wood Simon;Hermanson Chris |
分类号 |
H01L29/15;H01L31/0256;H01L23/48;H01L23/52;H01L29/40;H01L23/29;H01L23/31;H01L29/20;H01L29/78;H01L23/495;H01L23/00 |
主分类号 |
H01L29/15 |
代理机构 |
Myers Bigel & Sibley, P.A. |
代理人 |
Myers Bigel & Sibley, P.A. |
主权项 |
1. A transistor package comprising:
a lead frame; a wide band-gap semiconductor device attached to the lead frame using a die attach material with a bulk thermal conductivity greater than about 40 W/m-K and less than about 200 W/m-K and a flexural modulus less than about 20 GPa, and an over-mold that is molded at least part way around the lead frame and that substantially surrounds the wide band-gap semiconductor device, the over-mold having a glass transition temperature greater than about 135° C. and a flexural modulus less than about 20 GPa, wherein the over-mold has a thermal coefficient of expansion less than about 50 ppm/° C. at temperatures above the glass transition temperature and a coefficient of thermal expansion less than 18 ppm/° C. at temperatures below the glass transition temperature. |
地址 |
Durham NC US |