INTERFEROMETER FOR CHECKING BENDING ELEXURES OF QUASIPLANAR ARTICLE SURFACES,申请号SU19731914753-传众专利搜索

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发明名称	INTERFEROMETER FOR CHECKING BENDING ELEXURES OF QUASIPLANAR ARTICLE SURFACES
摘要
申请公布号	SU578562(A1)	申请公布日期	1977.10.30
申请号	SU19731914753	申请日期	1973.05.14
申请人	LE POLT I IM. M.I.KALININA	发明人	BUTUSOV MIKHAIL M,SU;ERMAKOVA NATALYA V,SU
分类号	G01B9/02;G01B11/24;(IPC1-7):G01B9/02	主分类号	G01B9/02
代理机构		代理人
主权项
地址

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