发明名称 Semiconductor structure with UBM layer and method of fabricating the same
摘要 A semiconductor structure with an under bump metallization (UBM) layer is provided. The semiconductor structure at least includes a substrate, a metal pad disposed on the substrate, an insulating layer covering the substrate and an edge of the metal pad, wherein at least one recess is disposed within the insulating layer and a first UBM layer contacts the metal pad. The recess is adjacent to the metal pad and the recess is in the shape of a ring. The first UBM layer contacts part of the recess.
申请公布号 US9502366(B2) 申请公布日期 2016.11.22
申请号 US201514609412 申请日期 2015.01.29
申请人 UNITED MICROELECTRONICS CORP. 发明人 Ho Kai-Kuang;Wang Chen-Hsiao;Hsu Yi-Feng
分类号 H01L23/52;H01L23/00 主分类号 H01L23/52
代理机构 代理人 Hsu Winston;Margo Scott
主权项 1. A semiconductor structure with an under bump metallization layer, comprising: a substrate; a metal pad disposed on the substrate; an insulating layer covering the substrate and an edge of the metal pad; at least one recess disposed within the insulating layer, wherein the recess is adjacent to the metal pad, and the recess is in a shape of a ring; and a first under bump metallization layer contacting the metal pad, wherein the first under bump metallization layer contacts part of the recess.
地址 Hsin-Chu TW