发明名称 POWER METAL-OXIDE-SEMICONDUCTOR - FIELD - EFFECT - TRANSI
摘要 <p>A planar high power Metal-Oxide-Semiconductor-Field-Effect-Transistor (MOSFET) including a substrate with an epitaxial layer on a surface thereof. A gate electrode including a strip of metal extending across a surface of the epitaxial layer and having a plurality of fingers extending therefrom along its length. The gate electrode being electrically insulated from the epitaxial layer by a layer of oxide. A source electrode in the surface of the epitaxial layer including fingers extending therefrom and interdigitating with the fingers of the gate electrode. There are p and n diffusion regions formed in the epitaxial layer except in an area under each of the gate fingers, which area remains undiffused. A drain electrode is connected to the surface of the substrate opposed to the surface upon which the epitaxial layer is deposited. During operation of the MOSFET as the blocking voltage across the transistor increases and the transistor is in the OFF state, the horizontal components of fields from the adjacent and closely spaced p-regions cancel each other so that voltage breakdown due to junction curvature is avoided.</p>
申请公布号 GB2031226(A) 申请公布日期 1980.04.16
申请号 GB19790031335 申请日期 1979.09.10
申请人 WEC 发明人
分类号 H01L29/08;H01L29/417;H01L29/78;(IPC1-7):01L29/78 主分类号 H01L29/08
代理机构 代理人
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