发明名称 |
Reflector and optical coating for improved LED lighting system |
摘要 |
Provided is a method including determining a first incident angle at which light from a light source will impinge on a first thin-film reflective stack of a planned first reflector for a lighting system. The method also includes determining a second incident angle at which light from the light source will impinge on a second thin-film reflective stack of a planned second reflector for the lighting system. The method further includes designing, using a processor executing a software package, the first reflector, comprising tuning a reflective characteristic of the first thin-film reflective stack as a function of the first incident angle determined, and designing, using the processor executing the software package, the second reflector, comprising tuning a reflective characteristic of the second thin-film reflective stack as a function of the second incident angle determined. |
申请公布号 |
US9471717(B2) |
申请公布日期 |
2016.10.18 |
申请号 |
US201414220199 |
申请日期 |
2014.03.20 |
申请人 |
GE Lighting Solutions, LLC |
发明人 |
Ward Benjamin James;Mayer Mark J;Saha Koushik;Cai Dengke;Smith Gabriel Michael |
分类号 |
G06F17/50;F21V7/00;F21V7/22;F21Y101/00 |
主分类号 |
G06F17/50 |
代理机构 |
GE Global Patent Operation |
代理人 |
DiMauro Peter T.;GE Global Patent Operation |
主权项 |
1. A multi-reflector lighting apparatus, comprising:
a first reflector having a first thin-film reflective stack, wherein the first reflector, when positioned for operation within the apparatus, will reflect light arriving at a first incident angle from a light source; and a second reflector having a second thin-film reflective stack, wherein the second reflector, when positioned for operation within the apparatus, will reflect light arriving at a second incident angle from the light source; wherein the first and second thin-film reflective thin-film reflective stacks include corresponding reflective characteristics tunable as a function of at least one of a plurality of factors associated with the lighting system; and wherein the reflective characteristic of the first thin-film reflective stack is tunable independently from the corresponding reflective characteristic of the second thin-film reflective stack. |
地址 |
East Cleveland OH US |