发明名称 Reflector and optical coating for improved LED lighting system
摘要 Provided is a method including determining a first incident angle at which light from a light source will impinge on a first thin-film reflective stack of a planned first reflector for a lighting system. The method also includes determining a second incident angle at which light from the light source will impinge on a second thin-film reflective stack of a planned second reflector for the lighting system. The method further includes designing, using a processor executing a software package, the first reflector, comprising tuning a reflective characteristic of the first thin-film reflective stack as a function of the first incident angle determined, and designing, using the processor executing the software package, the second reflector, comprising tuning a reflective characteristic of the second thin-film reflective stack as a function of the second incident angle determined.
申请公布号 US9471717(B2) 申请公布日期 2016.10.18
申请号 US201414220199 申请日期 2014.03.20
申请人 GE Lighting Solutions, LLC 发明人 Ward Benjamin James;Mayer Mark J;Saha Koushik;Cai Dengke;Smith Gabriel Michael
分类号 G06F17/50;F21V7/00;F21V7/22;F21Y101/00 主分类号 G06F17/50
代理机构 GE Global Patent Operation 代理人 DiMauro Peter T.;GE Global Patent Operation
主权项 1. A multi-reflector lighting apparatus, comprising: a first reflector having a first thin-film reflective stack, wherein the first reflector, when positioned for operation within the apparatus, will reflect light arriving at a first incident angle from a light source; and a second reflector having a second thin-film reflective stack, wherein the second reflector, when positioned for operation within the apparatus, will reflect light arriving at a second incident angle from the light source; wherein the first and second thin-film reflective thin-film reflective stacks include corresponding reflective characteristics tunable as a function of at least one of a plurality of factors associated with the lighting system; and wherein the reflective characteristic of the first thin-film reflective stack is tunable independently from the corresponding reflective characteristic of the second thin-film reflective stack.
地址 East Cleveland OH US