| 摘要 |
PURPOSE:To make possible a highly accurate analysis with little sampling error, by utilizing a localizing property of measuring position of a spark emission analyzing method and scanning the surface of the sample. CONSTITUTION:A scanning device 3 moving relatively between a sample 1 and a discharge electrode P along the surface of the sample and a memory which stores the data of positions of the electrode P of the surface of the sample and the data of an emission spectrochemical analysis at that position, are provided in a central controller 7. When scanning is finished, containing % of each element is computed basing on the data in an RAM and thus obtained containing % of each element is printed by a printer 9. Or, said percentage is recorded and is displayed as a contour line of density distribution of the aimed element by an X-Y plotter 10 because corresponding relation between an address of the RAM and the position on the surface of the sample is determined by a scanning program, or it is displayed by a CRT converting the density into the luminance and is displayed on a system console 8. |
