发明名称 ANALOG TESTER
摘要 PURPOSE:To shorten the measurement time considerably, by storing the final set value of the just preceding measurement and using this set value in the next measurement when the same lot is tested. CONSTITUTION:In the first measurement of one lot, a controller 31 turns a switch 33 to the side of a storage part 321, where an initial set value is stored, to measure the distortion rate. The value of a programmable attenuator 22 at this time is stored in a storage part 322 for the just preceding set value. In the second and following measurements, the switch 33 is turned to the side of said storage part 322, and measured data is converged to a certain set value with about one loop because electric properties of products resemble one another in one lot in these measurements. If measured data is not converged within a certain time because of an defective product, it is judged to be defective, and the initial set value is used in the test of the next product, and thus measurement is performed in the shortest time in any case.
申请公布号 JPS5987378(A) 申请公布日期 1984.05.19
申请号 JP19820198194 申请日期 1982.11.11
申请人 TOSHIBA KK 发明人 KIRA EIJI;YOSHINAGA MOTOAKI
分类号 G01R23/20;G01R31/26 主分类号 G01R23/20
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