发明名称 Method of forming deep aluminum doped silicon by implanting Al and Si ions through alumina layer and device formed thereby
摘要 In a method of producing a semiconductor device, an alumina layer is formed directly on a principal surface of a silicon substrate; aluminum and silicon are ion-implanted through the alumina layer into said substrate; and the substrate is thereafter annealed. The ion-implanted silicon yields better crystalline structure and increases the solid solubility limit of aluminum.
申请公布号 US4515642(A) 申请公布日期 1985.05.07
申请号 US19830525484 申请日期 1983.08.22
申请人 发明人
分类号 H01L21/22;H01L21/265;H01L21/266;H01L21/316;(IPC1-7):H01L21/26 主分类号 H01L21/22
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