发明名称 FORMATION OF RESIST PATTERN
摘要 PURPOSE:To stabilize the resist sensitivity by approaching a substrate, and a temperature control plate in a parallel state to cool during cooling after baking before developing. CONSTITUTION:A beam 1 is driven in the state that a double shutter 3 is opened to dispose a substrate 12 above a hot plate 6, and the substrate 12 is baked by the plate 6 and a heater 5. The substrate 12 on the beam 1 is set on four insulating pins 9, and a double shutter 3 is simultaneously closed. The four pins 9 are moved down, the substrate 12 on the pins 9 are contacted with a temperature control plate 8 to cool. Then, a walking beam 1 is driven to place the substrate 12 on the plate 8 on the beam 1, and conveyed to an exposure unit.
申请公布号 JPS61147527(A) 申请公布日期 1986.07.05
申请号 JP19840269985 申请日期 1984.12.21
申请人 TOSHIBA CORP 发明人 MATSUOKA YASUO;TSUCHIYA YOSHIJI
分类号 G03F7/30;G03F7/38;H01L21/027 主分类号 G03F7/30
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