| 摘要 |
<p>An apparatus for testing the operation of very high speed logic devices. Output signals from the device being tested are loaded into a spatial light modulator while running at normal clocking frequencies. After being fully loaded, a laster light source is pulsed to send a short light signal through the spatial light modulator and onto a light detector array. The spatially modulated light, which is imaged upon the detector array, corresponds to the bit stream of data from the output of the device under test. According to one embodiment, the modulated signal is compared to stored binary values by conventional logic circuits. According to another embodiment, a second spatial light modulator is used to form a coinciding image on the same detector array. This second image corresponds to the complement of the correct output signal. Optically adding the two images on the detector array and producing the electrical equivalents of the light signals to detect one of three possible intensity values gives information about the presence, location, and nature of errors in the output signal of the device under test. </p> |
