发明名称 Method for directly drawing lines in a refractory metal for use in integrated circuit devices
摘要 A laser beam 18 is used to directly draw lines in a refractory metal of a micrometre in size, at a speed of several centimetres per second on silicon surfaces 15. Metal lines made of tungsten 11, 12 are deposited selectively on the silicon surface by relying on the method of laser-induced vapour phase deposition. It is possible to obtain, on the silicon surface, regular lines several centimetres long and 2 to 15 micrometres wide by using an argon laser beam with a focused spot diameter of about 20 micrometres. The present method is more particularly useful in the fabrication of individualised integrated circuits, in the positioning of conductors as required in integrated circuits, in the correction of masks and in the correction of defects in large-scale integrated circuits and in liquid crystal display devices. <IMAGE>
申请公布号 FR2590408(A1) 申请公布日期 1987.05.22
申请号 FR19860015923 申请日期 1986.11.17
申请人 GENERAL ELECTRIC CY 发明人 YUNG SHENG LIU ET CHRISTOPHER PAUL KAKYMYSHYN;KAKYMYSHYN CHRISTOPHER PAUL
分类号 H01L21/268;H01L21/3205;H01L21/768;(IPC1-7):H01L21/285;H01L21/82 主分类号 H01L21/268
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