A method for the computer-controlled evaluation of photoelastic pictures

摘要

For metrological purposes, a method is proposed for quantitative evaluation of line systems which result from photoelastic photographs and from the interferometric measurement of photoelastic processes. The method is based on the combination of the following three features: a) Introduction of a purposive phase shift to the line system b) Taking of pictures with different phase positions and storing them on data-storage means c) Point-by-point determination and evaluation of the line systems by means of the stored pictures.