发明名称 Exposure method and exposure apparatus
摘要 The invention deals with an exposure apparatus which detects environmental conditions such as atmospheric pressure, temperature and humidity in which the exposure apparatus is placed, and which maintains the projected magnification constant at all times based upon the detected values, so that the pattern can be reproduced precisely. Concretely, the apparatus comprises a detector to detect at least one of the tube temperature of the optical projecting system, humidity or atmospheric pressure near the optical system, and a control unit which controls optical characteristics based upon the signals detected by the detector. Namely, the control unit adjusts the optical characteristics depending upon the environmental conditions thereby to adjust variation in the projecting magnification and/or variation in the focal position. Thus, variation in the optical characteristics is adjusted to transfer the pattern maintaining high precision.
申请公布号 US4699505(A) 申请公布日期 1987.10.13
申请号 US19850742786 申请日期 1985.06.10
申请人 HITACHI, LTD. 发明人 KOMORIYA, SUSUMU;NISHIZUKA, HIROSHI;NAKAGAWA, SHINYA;MAEJIMA, HISASHI
分类号 H01L21/30;G03F7/20;G03F7/207;H01L21/027;(IPC1-7):G03B27/42 主分类号 H01L21/30
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