COMPONENT CONCENTRATION ANALYSIS DEVICE AND COMPONENT CONCENTRATION ANALYSIS METHOD

摘要

PROBLEM TO BE SOLVED: To find the concentration of a sample to be measured, the measurement of which is difficult.SOLUTION: Provided is a component concentration analysis device comprising: a database 1 for holding a regression coefficient spectrum regarding the concentration of a desired sample to be measured; an irradiator 21 for irradiating the sample to be measured with an infrared ray; an optical detector 22 for receiving an infrared ray having passed through the sample to be measured; a radiator 23 for radiating a millimeter wave/terahertz (THz) wave to the sample to be measured; a radio wave detector 24 for detecting a millimeter wave/terahertz (THz) wave having passed through the sample to be measured; a dielectric measurement probe 25 of coaxial type having the functions of a radiator for radiating a millimeter wave/terahertz (THz) wave to the sample to be measured and a radio wave detector for detecting a millimeter wave/terahertz (THz) wave having passed through the sample to be measured; and an arithmetic unit 3 for finding the concentration of the sample to be measured by fitting the spectra obtained from the optical detector 22, the radio wave detector 24, and the dielectric measurement probe 25 to the regression coefficient spectrum held in the database 1.SELECTED DRAWING: Figure 1