| 摘要 |
A probe card for a testing apparatus of electronic devices is described comprising at least one testing head (21) which houses a plurality of contact probes (22), each contact probe (22) having at least one contact tip suitable to abut onto contact pads of a device under test (25), and a support plate (23) of the testing head (21) associated with a stiffener (24) and an intermediate support (26), connected to said support plate (23) and suitable to provide a spatial transformation of the distances between contact pads made on the opposite sides thereof. Conveniently, the probe card (20) comprises a support element (28) which is solidarized to the intermediate support (26), this support element (28) being made by means of a material having a greater stiffness than the intermediate support (26), thereby being able to provide local micro rectifications of the intermediate support (26). |
