| 摘要 |
PURPOSE:To inspect the appearance of an element to be measured at the same time during an electric test by forming the lid of a socket in a lens shape by using a transparent material and allowing the element to be measured to be viewed while mounted on a socket for measurement. CONSTITUTION:A socket main body 1 and the lid 3 of the socket are made of transparent materials and lenses 4 is formed on the lid 3. The socket main body 1 and the lid 3 of the socket are made of the transparent materials, so the IC 2 to be measured can be viewed even during an electric characteristic test, and the curvature, etc., of the IC to be measured can easily by decided because of the effect to the lenses 4. Thus, the time of an IC manufacturing process is shortened very effectively.
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