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发明名称
TEST HANDLER FOR SEMICONDUCTOR DEVICE
摘要
申请公布号
JPS6484163(A)
申请公布日期
1989.03.29
申请号
JP19870243069
申请日期
1987.09.28
申请人
MITSUBISHI ELECTRIC CORP
发明人
FURUSHIMA TAKENARI;TERAUCHI TSUNEO
分类号
G01R31/26;H01L21/66
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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