发明名称 Memory devices
摘要 Some embodiments include memory devices having a wordline, a bitline, a memory element selectively configurable in one of three or more different resistive states, and a diode configured to allow a current to flow from the wordline through the memory element to the bitline responsive to a voltage being applied across the wordline and the bitline and to decrease the current if the voltage is increased or decreased. Some embodiments include memory devices having a wordline, a bitline, memory element selectively configurable in one of two or more different resistive states, a first diode configured to inhibit a first current from flowing from the bitline to the wordline responsive to a first voltage, and a second diode comprising a dielectric material and configured to allow a second current to flow from the wordline to the bitline responsive to a second voltage.
申请公布号 US9466361(B2) 申请公布日期 2016.10.11
申请号 US201414518810 申请日期 2014.10.20
申请人 Micron Technology, Inc. 发明人 Mouli Chandra
分类号 G11C11/36;G11C13/00;G11C11/56;H01L27/24;H01L45/00;G11C5/02;G11C11/34 主分类号 G11C11/36
代理机构 Wells St. John P.S. 代理人 Wells St. John P.S.
主权项 1. A memory device comprising: a wordline; a bitline; a memory element between the wordline and the bitline; and a diode between the wordline and the bitline, the diode comprising at least one undoped layer, the at least one undoped layer being devoid of silicon.
地址 Boise ID US