发明名称 Semiconductor device of high breakdown voltage
摘要 The semiconductor device is of high break down voltage type and has a source, drain and a gate deposited therebetween on the semiconductor substrate. The gate oxide film has a thick portion and below that portion, a doped layer as a drain is provided with two layers having different impurity concentration.
申请公布号 US4990982(A) 申请公布日期 1991.02.05
申请号 US19890428017 申请日期 1989.10.26
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 OMOTO, KAYOKO;MIYATA, KAZUAKI
分类号 H01L21/336;H01L29/423;H01L29/78 主分类号 H01L21/336
代理机构 代理人
主权项
地址