发明名称 Power amplifier with built-in test circuit
摘要 A test circuit for use in testing amplifiers in order to check that they are functioning properly at operational power levels. The test circuit includes switching mechanisms which configure the amplifier in feedback mode in order to cause the amplifier to oscillate and a circuitry for measuring the power output of the amplifier during oscillation in order to thereby check that it is properly operational. The circuit may also include a load acting as a fixed attenuator for dissipating the power output of the amplifier and a bandpass filter for selecting an appropriate frequency of oscillation for the amplifier. The circuit may also include a control loop for regulating the amount of feedback and controlling the output power level.
申请公布号 US5006812(A) 申请公布日期 1991.04.09
申请号 US19890388180 申请日期 1989.08.01
申请人 ROCKWELL INTERNATIONAL CORPORATION 发明人 ERICKSON, ALAN R.
分类号 G01R31/28;G01R31/40 主分类号 G01R31/28
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