发明名称 |
METHOD OF MANUFACTURING NPN TRANSISTOR |
摘要 |
<p>A method of making NPN transistor for removing the crystal defect comprises the steps of ; (a) masking and implanting a phosphorus on bare wafer at 1050 deg.C; (b) annealing the implanted wafer at 950 deg.C; (c) locally oxidising an annealed wafer at 900 deg.C for a fixed time; (d) diffusing the phosphorus impurity to the n+ buried layer by annealing at 1150 deg.C. This method repress the generation of soft wave in breakdown voltage of collector-base.</p> |
申请公布号 |
KR910008944(B1) |
申请公布日期 |
1991.10.26 |
申请号 |
KR19880003359 |
申请日期 |
1988.03.28 |
申请人 |
SAM SUNG ELECTRONS CO. LTD. |
发明人 |
YUN SOG-BONG;LEE DONG-HUI |
分类号 |
H01L29/70;(IPC1-7):H01L29/70 |
主分类号 |
H01L29/70 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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