发明名称 METHOD OF MANUFACTURING NPN TRANSISTOR
摘要 <p>A method of making NPN transistor for removing the crystal defect comprises the steps of ; (a) masking and implanting a phosphorus on bare wafer at 1050 deg.C; (b) annealing the implanted wafer at 950 deg.C; (c) locally oxidising an annealed wafer at 900 deg.C for a fixed time; (d) diffusing the phosphorus impurity to the n+ buried layer by annealing at 1150 deg.C. This method repress the generation of soft wave in breakdown voltage of collector-base.</p>
申请公布号 KR910008944(B1) 申请公布日期 1991.10.26
申请号 KR19880003359 申请日期 1988.03.28
申请人 SAM SUNG ELECTRONS CO. LTD. 发明人 YUN SOG-BONG;LEE DONG-HUI
分类号 H01L29/70;(IPC1-7):H01L29/70 主分类号 H01L29/70
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