首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
METHOD DETECTING RELATION BETWEEN SUBSTRATE DAMAGE IN DRY ETCHING PROCESSING AND PRO- CESSING PARAMETER
摘要
申请公布号
JPH04216625(A)
申请公布日期
1992.08.06
申请号
JP19910059714
申请日期
1991.02.28
申请人
SIEMENS AG
发明人
MANFUREETO ENGERUHARUTO
分类号
H01L21/302;H01L21/3065;H01L21/66
主分类号
H01L21/302
代理机构
代理人
主权项
地址
您可能感兴趣的专利
REAPER WITH BINDER
BUSH CUTTER
SEEDER FOR DRILLING
METHOD OF ANODIZING ALUMINUM ELECTRODE FOR ELECTROLYTIC CONDENSER
DUAL SPECTRUM INFARED FIRE SENSOR.
DETECTING PARTICLES.
METHOD FOR TESTING THE FLUID TIGHTNESS OF A TEST OBJECT.
SKELETON-FRAME SYSTEM FOR THE ERECTION OF BUILDING CONSTRUCTIONS.
CAPO.
Starting device for an elevator.
SEMICONDUCTOR MEMORY DEVICE
DIAPERS
N2-ARYLSULFONYL-L-ARGININAMIDES AND THE PHARMACEUTICALLY ACCEPTABEL SALTS THEREOF
PROCESS AND APPARATUS FOR THE PRODUCTION OF FINELY-DIVIDED METAL AND METALLOID OXIDES
DIBENZOCYCLOHEPTENYLIDENE PIPERIDINES
Toothpaste.
Equipment for the continuous contactless control of the structural condition of a cold-drawn band.
Product and process for pretreating cellulosic fibres which are then transfer-printed.
Electric capacitor.
Radio apparatus or record player provided with electrical plugs on the back side.
