发明名称 |
Semiconductor memory device and operating method thereof |
摘要 |
There are provided a semiconductor memory device and an operating method thereof. A semiconductor memory device includes a memory cell array including a plurality of memory cells connected between a source select transistor and a drain select transistor, a peripheral circuit for performing a program operation on the memory cell array, and a control logic for controlling the peripheral circuit such that the potential level of a source control voltage applied to the source select transistor as a selected memory cell is closer to the drain select transistor in a program verify operation during the program operation. |
申请公布号 |
US9524793(B1) |
申请公布日期 |
2016.12.20 |
申请号 |
US201615052279 |
申请日期 |
2016.02.24 |
申请人 |
SK hynix Inc. |
发明人 |
Lee Hee Youl |
分类号 |
G11C11/34;G11C16/04;G11C16/34;G11C16/10 |
主分类号 |
G11C11/34 |
代理机构 |
William Park & Associates Ltd. |
代理人 |
William Park & Associates Ltd. |
主权项 |
1. A semiconductor memory device, comprising:
a memory cell array configured to include a plurality of memory cells connected between a source select transistor and a drain select transistor; a peripheral circuit configured to perform a program operation on the memory cell array; and a control logic configured to control the peripheral circuit such that the potential level of a source control voltage applied to the source select transistor is increased by a first offset voltage as a selected memory cell is closer to the drain select transistor in a program verify operation during the program operation, wherein the first offset voltage is a voltage variable according to a channel width of the selected memory cell. |
地址 |
Icheon-si, Gyeonggi-do KR |