| 摘要 |
<p>A projection inspector which projects the image of an object being measured onto a screen for a visual inspection. It may be used with a microscope for observation in detail. Unlike the conventional projection inspector, the inspector fully exhibits high degree of measuring function even at the time of inspecting an object having a surface color and shape that can be difficultly imaged, and projects the object's image onto the screen to inspect it, and further enables the object's image to be more correctly observed or inspected using a microscope. The projection inspector is provided with a projection lens mount that is movable two-dimensionally and mounts a projection lens that constitutes a portion of the projection optical system over a plate on which the object to be measured is placed, and the object's image is projected onto the screen via the projection optical system as it is irradiated with the light of illumination, wherein the projection lens mount is replaceable by a microscope mount having an eyepiece, a reference index is provided in the visual field of the eyepiece, and the plate is provided with an indicator that indicates the amount of movement. <IMAGE></p> |
