| 发明名称 |
CIRCUIT AND A METHOD FOR MEASURING A QUANTITY INFLUENCING THE CAPACITANCE-VOLTAGE CHARACTERISTIC OF A CAPACITIVE ELEMENT |
| 摘要 |
PCT No. PCT/EP90/00612 Sec. 371 Date Sep. 25, 1991 Sec. 102(e) Date Sep. 25, 1991 PCT Filed Apr. 17, 1990 PCT Pub. No. WO90/13793 PCT Pub. Date Nov. 15, 1990.A circuit and a method for measuring a quantity influencing the capacitance-voltage characteristic of a capacitive element, the measuring accuracy and the signal-to-noise-ratio being improved by determining such quantity on the basis of the area under the curve of the capacitance-voltage characteristic.
|
| 申请公布号 |
US5235267(A) |
申请公布日期 |
1993.08.10 |
| 申请号 |
US19910768440 |
申请日期 |
1991.09.25 |
| 申请人 |
FRAUNHOFER-GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG E.V. |
发明人 |
SCHOENEBERG, UWE;BEDRICH, HOSTICKA;MACLAY, JORDAN;ZIMMER, GUENTHER |
| 分类号 |
G01R27/26;G01D5/24;G01N27/22 |
主分类号 |
G01R27/26 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
