发明名称 Methods and apparatuses for measuring effective atomic number of an object
摘要 Methods and apparatuses for measuring an effective atomic number of an object are disclosed. The apparatus includes: a ray source configured to product a first X-ray beam having a first energy and a second X-ray beam having a second energy; a Cherenkov detector configured to receive the first X-ray beam and the second X-ray beam that pass through an object under detection, and to generate a first detection value and a second detection value; and a data processing device configured to obtain an effective atomic number of the object based on the first detection value and the second detection value. The Cherenkov detector can eliminate disturbance of X-rays below certain energy threshold with respect to the object identification, and thus accuracy can be improved for object identification.
申请公布号 US9464997(B2) 申请公布日期 2016.10.11
申请号 US201214129669 申请日期 2012.12.28
申请人 Nuctech Company Limited;Tsinghua University 发明人 Li Shuwei;Chen Zhiqiang;Li Yuanjing;Zhao Ziran;Liu Yinong;Zhang Qingjun;Zhu Weibin;Wang Yi;Zhao Shuqing;Zhang Wenjian
分类号 G01N23/087;G01T1/22 主分类号 G01N23/087
代理机构 Westman, Champlin & Koehler, P.A. 代理人 Westman, Champlin & Koehler, P.A.
主权项 1. An apparatus for measuring an effective atomic number of an object, comprising: a ray source configured to product a first X-ray beam having a first energy and a second X-ray beam having a second energy; a Cherenkov detector configured to receive the first X-ray beam and the second X-ray beam that pass through an object under detection, and to generate a first detection value and a second detection value; and a data processing device configured to obtain an effective atomic number of the object based on the first detection value and the second detection value; wherein the Cherenkov detector comprises a radiator configured to receive incident first X-ray beam and second X-ray beam and generate Cherenkov light, a photodetector configured to detect the Cherenkov light and generate electric signals, and an auxiliary circuit configured to generate the first detection value and the second detection value based on the electric signals; a surface of the photodetector that receives the Cherenkov light is approximately parallel to an incident direction of the first X-ray beam and second X-ray beam, and the radiator comprises a first part and a second part coupled and perpendicular to the first part, wherein the photodetector is provided at an end of the first part, and the first X-ray beam and the second X-ray beam enter the second part in a direction approximately parallel to the second part.
地址 Beijing CN
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