发明名称 Optical submicron aerosol particle detector
摘要 A particle detector that determines the presence of particles in an enclosed volume includes a laser that directs an optical beam to a beam splitter that produces first and second beams. An optical system directs the first beam into the enclosed volume. A detector is positioned adjacent the volume in order to receive back scattered optical energy arising from a particle in the volume encountering the first beam. The back scattered optical energy and the second beam are optically combined so as to overlap in a region and in the overlap region the back scattered optical energy and second beam are in the same state of focus, of the same polarization and are substantially parallel. A detector located at the overlap region produces an electrical signal indicative of the intensity of the back scattered light. A signal processor analyzes the electrical signal to determine the presence of the particle.
申请公布号 US5294806(A) 申请公布日期 1994.03.15
申请号 US19930017214 申请日期 1993.02.12
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BATCHELDER, JOHN S.;DECAIN, DONALD M.;HOBBS, PHILIP C. D.
分类号 G01N15/10;G01N15/02;G01N15/14;G01N21/21;G01N21/47;G01N21/94;(IPC1-7):G01N15/06 主分类号 G01N15/10
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