发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE HAVING SOI STRUCTURE
摘要 The method is for forming a MOS device on a silicon substrate by using a silicon on insulator (SOI) method so that a parasitic steps of: (A) forming an inpurity layer on a active region of a semiconductor substrate; (B) forming a trench to separate an impurity layer into two parts and forming oxide layer; (C) etching a certain area of an oxide layer to expose a substrate and forming a semiconductor layer on a trench by using a selective epitaxial growing method so that SOI structure is formed; and (D) forming a gate electrode on a SEG layer.
申请公布号 KR940006671(B1) 申请公布日期 1994.07.25
申请号 KR19910017901 申请日期 1991.10.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, BYONG - RYOL
分类号 H01L21/335;(IPC1-7):H01L21/335 主分类号 H01L21/335
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