发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE HAVING SOI STRUCTURE |
摘要 |
The method is for forming a MOS device on a silicon substrate by using a silicon on insulator (SOI) method so that a parasitic steps of: (A) forming an inpurity layer on a active region of a semiconductor substrate; (B) forming a trench to separate an impurity layer into two parts and forming oxide layer; (C) etching a certain area of an oxide layer to expose a substrate and forming a semiconductor layer on a trench by using a selective epitaxial growing method so that SOI structure is formed; and (D) forming a gate electrode on a SEG layer.
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申请公布号 |
KR940006671(B1) |
申请公布日期 |
1994.07.25 |
申请号 |
KR19910017901 |
申请日期 |
1991.10.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, BYONG - RYOL |
分类号 |
H01L21/335;(IPC1-7):H01L21/335 |
主分类号 |
H01L21/335 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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