发明名称 Integrated vacuum microelectronic device and fabrication method thereof
摘要 An integrated vacuum microelectronic device comprises: a highly doped semiconductor substrate, at least one insulating layer) placed above said doped semiconductor substrate, a vacuum aperture formed within said at least one insulating layer and extending to the highly doped semiconductor substrate, a first metal layer acting as a cathode, a second metal layer placed under said highly doped semiconductor substrate and acting as an anode. The first metal layer is placed adjacent to the upper edge of the vacuum aperture and the vacuum aperture has a width dimension such as the first metal layer remains suspended over the vacuum aperture.
申请公布号 US9508520(B2) 申请公布日期 2016.11.29
申请号 US201414290583 申请日期 2014.05.29
申请人 STMICROELECTRONICS S.R.L. 发明人 Patti Davide Giuseppe
分类号 H01J1/304;H01J9/02;H01J21/10 主分类号 H01J1/304
代理机构 Seed IP Law Group LLP 代理人 Seed IP Law Group LLP
主权项 1. An integrated vacuum microelectronic device comprising: a doped semiconductor substrate, at least one insulating layer placed above said doped semiconductor substrate, a vacuum aperture formed within said at least one insulating layer and extending to the doped semiconductor substrate, a first metal layer placed above said vacuum aperture and configured to act as a cathode, and a second metal layer placed under said doped semiconductor substrate and configured to act as an anode, wherein said first metal layer is placed adjacent to an upper edge of said vacuum aperture, said vacuum aperture having a width dimension such that the first metal layer remains suspended over and seals said vacuum aperture.
地址 Agrate Brianza IT