| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection pattern automatic generation device with which it is possible to extract an effectively used inspection pattern from past inspection patterns when automatically generating a new inspection pattern utilizing the past inspection patterns.SOLUTION: An inspection pattern automatic generation device comprises: an extraction unit for extracting, from a plurality of inspection patterns created in the past, an inspection pattern that satisfies a condition that a boundary value inspection can be executed on a boundary value included in the software to be inspected within a 1 LSB range before and after the boundary value and/or a condition that the plurality of inspection patterns pass a path, out of a path from the input to output of the software, where the passage rate of the inspection patterns is less than or equal to a prescribed rate; and an automatic generation unit for automatically generating an inspection pattern with which the software is inspected singly, on the basis of the inspection pattern extracted by the extraction unit.SELECTED DRAWING: Figure 3 |
