发明名称 METAL CONTACT FORMING METHOD OF SEMICONDUCTOR DEVICE
摘要 The method consists of a step of forming a polysilicon layer between a field oxide layer and an interlevel insulating layer, a step of foming the first contact hole to make metal pattern and filling it with plug material, a step of depositing the first and the second metal thin film sequentially, a step of forming the second contact hole by etching the first metal thin film and the insulating layer sequentially, and a step of depositing Al alloy after removing a photoresist layer and etching the second metal thin film.
申请公布号 KR950010858(B1) 申请公布日期 1995.09.25
申请号 KR19920019287 申请日期 1992.10.20
申请人 HYUNDAI ELECTRONIC INDUSTRY CO., LTD. 发明人 CHOE, KYONG - KUN
分类号 H01L21/28;H01L21/027;H01L21/30;H01L21/3205;H01L21/768;H01L23/52;H01L23/522;(IPC1-7):H01L21/28 主分类号 H01L21/28
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