发明名称 |
EXPOSURE DEVICE AND POSITIONING METHOD |
摘要 |
PURPOSE:To accurately detect the position of an alignment mark by detecting the step difference of the alignment mark formed on a photosensitive base board by using a probe in which a distance from the photosensitive surface is kept constant. CONSTITUTION:In a device for exposing the pattern of a mask to a photosensitive substrate (W) placed on a stage, the device is provided with a mark detecting means 18 having a probe 24 provided at a nearly constant distance from the center of an exposure field of view to move vertical to the surface of a photosensitive substrate so as to keep a distance from the surface constant, a stage position detecting means 12 for detecting the moving coordinate of a stage 9 and a computing means for outputting a mark position from the detection signal of the mark detecting means and the moving coordinates of the stage position detecting means.
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申请公布号 |
JPH0845814(A) |
申请公布日期 |
1996.02.16 |
申请号 |
JP19940175842 |
申请日期 |
1994.07.27 |
申请人 |
NIKON CORP |
发明人 |
OTA KAZUYA;NAKAYAMA SHIGERU |
分类号 |
G03F7/20;G03F9/00;H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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