发明名称 EXPOSURE DEVICE AND POSITIONING METHOD
摘要 PURPOSE:To accurately detect the position of an alignment mark by detecting the step difference of the alignment mark formed on a photosensitive base board by using a probe in which a distance from the photosensitive surface is kept constant. CONSTITUTION:In a device for exposing the pattern of a mask to a photosensitive substrate (W) placed on a stage, the device is provided with a mark detecting means 18 having a probe 24 provided at a nearly constant distance from the center of an exposure field of view to move vertical to the surface of a photosensitive substrate so as to keep a distance from the surface constant, a stage position detecting means 12 for detecting the moving coordinate of a stage 9 and a computing means for outputting a mark position from the detection signal of the mark detecting means and the moving coordinates of the stage position detecting means.
申请公布号 JPH0845814(A) 申请公布日期 1996.02.16
申请号 JP19940175842 申请日期 1994.07.27
申请人 NIKON CORP 发明人 OTA KAZUYA;NAKAYAMA SHIGERU
分类号 G03F7/20;G03F9/00;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/20
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