A STRESS CELL FOR A SCANNING PROBE MICROSCOPE

摘要

A novel stress cell for applying stress in-situ to a sample in a scanning probe microscope. It has a loading clamp (4) mounted on a sample stage (1) which is magnetically mounted to a scanning tunneling microscope or atomic force microscope. A wedge (2) is placed on top of the sample stage (1). A clamp (4) holds a sample (7) with its two arms (3) pulling the sample (7) against the wedge (2). It is fastened by a micrometer (5) which is driven by a motor (10). A force-sensor (17) is placed between the clamp (4) and the stage (1) to measure the force applied. This cell provides a superior stability and straightforward operation procedure for studying stress related problems in materials.